| | Sponsored Links
| | CAMECA
CAMECA provides in-Fab and near-Fab Metrology Equipment for the worldwide semiconductor, based on LEXES and SIMS analytical techniques. CAMECA also provides advanced Research Instruments for the most prestigious laboratories in universities, governmental organizations and private companies in materials, geology, astrophysics, semiconductors and life sciences. The techniques include EPMA, SIMS and Atom Probe.
http://www.cameca.fr/ |
| | HORIBA Jobin Yvon
Analytical and spectroscopic systems and components.
http://www.jobinyvon.com/ |
| | ION-TOF GmbH
Time-of-Flight secondary ion mass spectrometry (TOF-SIMS).
http://www.iontof.com |
| | JEOL Ltd.
Scanning electron microscopes (SEMs), transmission electron microscopes (TEMs), scanning probe microscopes (SPMs), mass spectrometers, NMR spectrometers, and semiconductor tools for scientific and industrial purposes.
http://www.jeol.com |
| | Kratos Analytical
Kratos manufactures XPS (ESCA), reflectron MALDI TOF, XRD, and XRF instruments for research and routine use and their data systems.
http://www.kratos.com/ |
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